Diffraction Analysis of the Microstructure of Materials

Eric J. Mittemeijer

ISBN 10: 3540405194 / ISBN 13: 9783540405191

Published by Springer, Berlin, Springer Berlin Heidelberg, Springer, 2003

About this Item

Neuware - Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics andsupplies readers sufficient information to apply the methods themselves.

Seller Inventory # 9783540405191

Bibliographic Details

• Title: Diffraction Analysis of the Microstructure of Materials
• Publisher: Springer, Berlin, Springer Berlin Heidelberg, Springer
• Publication Date: 2003
• Language: English
• ISBN 10: 3540405194
• ISBN 13: 9783540405191
• Binding: Buch
• Condition: Neu

About this title

Synopsis

Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.