Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs

Noia, Brandon

ISBN 10: 3319345346 ISBN 13: 9783319345345
Published by Springer, 2016
Language: English
Condition: New Soft cover

Sold by Biblios, Frankfurt am main, HESSE, Germany

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New - Soft cover

Condition: New

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