Design for Manufacturability and Yield for Nano-Scale CMOS

Language: English

Published by Springer Netherlands Jul 2007, 2007

1402051875 / 9781402051876

Series: Book 5 of 34 - Integrated Circuits and Systems

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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Hardcover

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Item description from seller

This item is printed on demand - it takes 3-4 days longer - Neuware -This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development. 288 pp. Englisch.

Seller Inventory # 9781402051876

Title
Design for Manufacturability and Yield for Nano-Scale CMOS
Author
Jamil Kawa
Publisher
Springer Netherlands Jul 2007
Publication year
2007
Condition
Neu
Binding
Buch
Language
English
ISBN 10
1402051875
ISBN 13
9781402051876
Item weight
600 grams
Dimensions
241x160x22 mm
Series
Book 5 of 34: Integrated Circuits and Systems

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

Item5 to 15 business days5 to 15 business days
First item£ 19.47£ 19.47
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BuchWeltWeit Ludwig Meier e.K.

Germany