Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing (34))

Language: English

Published by Springer, 2007

0387465464 / 9780387465463

Series: Book 18 of 40 - Frontiers in Electronic Testing

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Title
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing (34))
Author
Sachdev, Manoj, Pineda de Gyvez, José
Publisher
Springer
Publication year
2007
Condition
Like New
Book Type
book
Binding
Hardcover
Language
English
ISBN 10
0387465464
ISBN 13
9780387465463
Edition
2nd Edition
Series
Book 18 of 40: Frontiers in Electronic Testing

Mispah books

Redhill, Surrey, United Kingdom

4-star seller

AbeBooks seller since April 15, 2021

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We have collection of General books ,Science Books, Fiction & Academic Books. we ship from multiple location. Delhi, US and UK Return Address Mispah books 1A Beechwood Villas, Salford Redhill , Surrey RH1 5EY United Kingdom

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