Defect Control in Semiconductors: Proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors The Yokohama 21st Century Forum Yokohama, Japan, September 17-22, 1989 (2 vols.set/ 2 Bände KOMPLETT)

Sumino, K.:

ISBN 10: 0444884297 ISBN 13: 9780444884299
Published by Elsevier Science Ltd.;, 1990
Language: English
Condition: Used - Very good Hardcover

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Used - Hardcover

Condition: Used - Very good

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