A Deep Learing Approach for On-Site Plant Leaf Detection. This item is unavailable.A Deep Learing Approach for On-Site Plant Leaf Detection

Proposed System shows usefulness of integration of an image analyzer aided with pattern recognition within a diagnostic expert system model. In order to diagnose a disorder from leaf image four image processing phases have to be applied: Image enhancement, Image segmentation, Feature extraction, & classification. In order to employ proposed system we first have to train it with a set of images of disorders. Applying this model to any other crop disorder requires only spatial care to be taken in order to acquire a sufficient set of images for training purpose as representative of these disorders. Due to integration of this proposed system diagnosis accuracy will increase. Proposed system focuses on specific disorder's identification, it can be extended in order to include more disorders.