Decision Patterns on Software Metrices for Single& Multiple Projects

Language: English

Published by LAP LAMBERT Academic Publishing Feb 2017, 2017

3330049553 / 9783330049550

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -In this research book found the Methods for detecting decision patterns on software metrics for single and associated multiple projects while implantation of SDLC Phases for reinforced taking optimal way for decision making which helps a lot for client in terms of business process improvement.In our first model, a preprocessed based hybrid Bayesian network was implemented to handle large number of metrics for multi-defect decision patterns and other a new ensemble defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns and also establishing a new privacy preserving based defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns. 200 pp. Englisch.

Seller Inventory # 9783330049550

Title
Decision Patterns on Software Metrices for Single& Multiple Projects
Author
Nageswara Rao Moparthi
Publisher
LAP LAMBERT Academic Publishing Feb 2017
Publication year
2017
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
3330049553
ISBN 13
9783330049550
Item weight
316 grams
Dimensions
220x150x12 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

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BuchWeltWeit Ludwig Meier e.K.

Germany