Computerized Multistage Testing : Theory and Applications

Yan, Duanli (EDT); Von Davier, Alina A. (EDT); Lewis, Charles (EDT)

ISBN 10: 1032477385 ISBN 13: 9781032477381
Published by Chapman and Hall/CRC, 2023
Language: English
Used Condition: As New Soft cover

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Used - Soft cover

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