Characterization of Crystal Growth Defects by X-Ray Methods

Language: English

Published by Springer US, 2012

147571128X / 9781475711288

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Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book contains the proceedings of a NATO Advanced Study Institute entitled Characterization of Crystal Growth Defects by X-ray Methods held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electroni.

Seller Inventory # 4206988

Title
Characterization of Crystal Growth Defects by X-Ray Methods
Author
B.K. Tanner
Publisher
Springer US
Publication year
2012
Condition
New
Binding
Soft cover
Language
English
ISBN 10
147571128X
ISBN 13
9781475711288

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

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