Characterisation of Radiation Damage by Transmission Electron Microscopy

Language: English

Published by Taylor and Francis Ltd, GB, 2000

075030748X / 9780750307482

Series: Book 3 of 5 - Series in Microscopy in Materials Science

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Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical techniques. Techniques are illustrated with examples, providing a solid overview of the contribution of TEM to radiation damage mechanisms. The book is most useful to researchers in, or entering into, the field of defect analysis in materials.

Seller Inventory # LU-9780750307482

Title
Characterisation of Radiation Damage by Transmission Electron Microscopy
Author
M.L Jenkins, M.A Kirk
Publisher
Taylor and Francis Ltd, GB
Publication year
2000
Condition
New
Binding
Hardback
Language
English
ISBN 10
075030748X
ISBN 13
9780750307482
Item weight
540 grams
Series
Book 3 of 5: Series in Microscopy in Materials Science

Rarewaves.com USA

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