CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Hardcover)

Book 21 of 40: Frontiers in Electronic Testing

Andrei Pavlov

ISBN 10: 1402083629 ISBN 13: 9781402083624
Published by Springer-Verlag New York Inc., New York, NY, 2008
Language: English
Condition: New Hardcover

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