Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach

Li, Xiaowei; Yan, Guihai; Liu, Cheng

ISBN 10: 9811985537 ISBN 13: 9789811985539
Published by Springer, 2024
Language: English
Condition: New Soft cover

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New - Soft cover

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