Built-In Test For VLSI: Pseudorandom Techniques.

Bardell, Paul H., William H. McAnney and Jacob Savir:

ISBN 10: 0471624632 ISBN 13: 9780471624639
Published by John Wiley & Sons, 1987
Language: English
Condition: Used - Very good Hardcover

Sold by books4less (Versandantiquariat Petra Gros GmbH & Co. KG), Welling, Germany

AbeBooks Seller since 18 March 2011

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

View this seller's items


Used - Hardcover

Condition: Used - Very good

Price:
£ 4.84
£ 13.77 shipping
Ships from Germany to U.S.A.

Quantity: 1 available

Add to basket