Biometric Quality: The Last 1%: Biometric Quality Assessment for Error Suppression

Tabassi, Elham; Grother, Patrick; National Institute Of Standards And Technology (NIST)

ISBN 10: 1495984508 ISBN 13: 9781495984501
Published by CreateSpace Independent Publishing Platform, 2008
Language: English
Condition: New Soft cover

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New - Soft cover

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