Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis (Methods of Surface Characterization, 5) [Hardcover] Czanderna, Alvin W.; Madey, Theodore E. and Powell, Cedric J.

Czanderna, Alvin W. [Editor]; Madey, Theodore E. [Editor]; Powell, Cedric J. [Editor];

ISBN 10: 0306458969 ISBN 13: 9780306458965
Published by Springer, 1998
Language: English
Condition: Used - Very good Hardcover

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Used - Hardcover

Condition: Used - Very good

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