Bayesian Workflow

Gelman, Andrew; Vehtari, Aki; McElreath, Richard; Simpson, Daniel; Margossian, Charles C.; Yao, Yuling; Kennedy, Lauren; Gabry, Jonah; Bürkner, Paul-Christian; Modrák, Martin; Barajas, Vianey Leos

ISBN 10: 0367490188 ISBN 13: 9780367490188
Published by Chapman and Hall/CRC, 2026
Language: English
Condition: New Hardcover

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