Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks

Krinsley, David H.; Pye, Kenneth; Boggs Jr, Sam; Tovey, N. Keith

ISBN 10: 0521019745 ISBN 13: 9780521019743
Published by Cambridge University Press, 2005
Language: English
Condition: New Soft cover

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