Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products

Bowen, W. Richard; Hilal, Nidal

ISBN 10: 1856175170 ISBN 13: 9781856175173
Published by Butterworth-Heinemann, 2009
Language: English
Condition: Used - As new Hardcover

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Used - Hardcover

Condition: Used - As new

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