Atomic Force Microscopy in Adhesion Studies

Language: English

Published by CRC Press, 2005

906764434X / 9789067644341

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J. Drelich, Kash L. MittalSince its discovery, Atomic Force Microscopy (AFM) has become a technique of choice for non-destructive surface characterization with sub-molecular resolution. The AFM has also emerged as a problem-solving tool in applications.

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Title
Atomic Force Microscopy in Adhesion Studies
Author
Drelich, J.
Publisher
CRC Press
Publication year
2005
Condition
New
Binding
Gebunden
Language
English
ISBN 10
906764434X
ISBN 13
9789067644341

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item26 to 60 business days26 to 60 business days
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