Astronomical Image and Data Analysis

F. Murtagh

ISBN 10: 3540330240 / ISBN 13: 9783540330240

Published by Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2006

About this Item

Druck auf Anfrage Neuware - Printed after ordering - With information and scale as central themes, this comprehensive survey explains how to handle real problems in astronomical data analysis using a modern arsenal of powerful techniques. It treats those innovative methods of image, signal, and data processing that are proving to be both effective and widely relevant. The authors are leaders in this rapidly developing field and draw upon decades of experience. They have been playing leading roles in international projects such as the Virtual Observatory and the Grid.The book addresses not only students and professional astronomers and astrophysicists, but also serious amateur astronomers and specialists in earth observation, medical imaging, and data mining. The coverage includes chapters or appendices on: detection and filtering; image compression; multichannel, multiscale, and catalog data analytical methods; wavelets transforms, Picard iteration, and software tools.This second edition of Starck and Murtagh's highly appreciated reference again deals with topics that are at or beyond the state of the art. It presents material which is more algorithmically oriented than most alternatives and broaches new areas like ridgelet and curvelet transforms. Throughout the book various additions and updates have been made.

Seller Inventory # 9783540330240

Bibliographic Details

• Title: Astronomical Image and Data Analysis
• Publisher: Springer Berlin Heidelberg, Springer Berlin Heidelberg
• Publication Date: 2006
• Language: English
• ISBN 10: 3540330240
• ISBN 13: 9783540330240
• Binding: Buch
• Edition: 2nd Edition
• Condition: Neu

About this title

Synopsis

Thisbookpresentsmaterialwhichismorealgorithmicallyorientedthanmost alternatives.Italsodealswithtopicsthatareatorbeyondthestateoftheart. Examples include practical and applicable wavelet and other multiresolution transform analysis. New areas are broached like the ridgelet and curvelet transforms. The reader will ?nd in this book an engineering approach to the interpretation of scienti?c data. Compared to the 1st Edition, various additions have been made throu- out, and the topics covered have been updated. The background or en- ronment of this book's topics include continuing interest in e-science and the virtual observatory, which are based on web based and increasingly web service based science and engineering. Additional colleagues whom we would like to acknowledge in this 2nd edition include: Bedros Afeyan, Nabila Aghanim, Emmanuel Cand' es, David Donoho, Jalal Fadili, and Sandrine Pires, We would like to particularly - knowledge Olivier Forni who contributed to the discussion on compression of hyperspectral data, Yassir Moudden on multiwavelength data analysis and Vicent Mart' ?nez on the genus function. The cover image to this 2nd edition is from the Deep Impact project. It was taken approximately 8 minutes after impact on 4 July 2005 with the CLEAR6 ?lter and deconvolved using the Richardson-Lucy method. We thank Don Lindler, Ivo Busko, Mike A'Hearn and the Deep Impact team for the processing of this image and for providing it to us.

From the Back Cover

With information and scale as central themes, this comprehensive survey explains how to handle real problems in astronomical data analysis using a modern arsenal of powerful techniques. It treats those innovative methods of image, signal, and data processing that are proving to be both effective and widely relevant. The authors are leaders in this rapidly developing field and draw upon decades of experience. They have been playing leading roles in international projects such as the Virtual Observatory and the Grid.
The book addresses not only students and professional astronomers and astrophysicists, but also serious amateur astronomers and specialists in earth observation, medical imaging, and data mining. The coverage includes chapters or appendices on: detection and filtering; image compression; multichannel, multiscale, and catalog data analytical methods; wavelets transforms, Picard iteration, and software tools.

This second edition of Starck and Murtagh's highly appreciated reference again deals with topics that are at or beyond the state of the art. It presents material which is more algorithmically oriented than most alternatives and broaches new areas like ridgelet and curvelet transforms. Throughout the book various additions and updates have been made.