Assessing Fault Model and Test Quality

Language: English

Published by Springer, Springer Okt 1991, 1991

0792392221 / 9780792392224

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This item is printed on demand - Print on Demand Titel. Neuware -For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing is still viable. Attempts at answering this question have not been wholly satisfying due to a lack of true quantification, statistical significance, and/or high computational expense. In this monograph we introduce a methodology to address the ques tion in a manner which circumvents the drawbacks of previous approaches. The method is based on symbolic Boolean functional analyses using Or dered Binary Decision Diagrams (OBDDs). OBDDs have been conjectured to be an attractive representation form for Boolean functions, although cases ex ist for which their complexity is guaranteed to grow exponentially with input cardinality. Classes of Boolean functions which exploit the efficiencies inherent in OBDDs to a very great extent are examined in Chapter 7. Exact equa tions giving their OBDD sizes are derived, whereas until very recently only size bounds have been available. These size equations suggest that straight forward applications of OBDDs to design and test related problems may not prove as fruitful as was once thought.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 156 pp. Englisch.…

Seller Inventory # 9780792392224

Title
Assessing Fault Model and Test Quality
Author
Kenneth M. Butler
Publisher
Springer, Springer Okt 1991
Publication year
1991
Condition
Neu
Binding
Buch
Language
English
ISBN 10
0792392221
ISBN 13
9780792392224
Item weight
407 grams
Dimensions
241x160x14 mm

buchversandmimpf2000

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