Applied Scanning Probe Methods I.

Bhushan, B.; H. Fuchs; S. Hosaka (eds.)

ISBN 10: 3540005277 / ISBN 13: 9783540005278

Published by Berlin, Springer., 2004

About this Item

338 figs., XX, 476 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. NanoScience and Technology. Sprache: Englisch.

Seller Inventory # 1809HB

Bibliographic Details

• Title: Applied Scanning Probe Methods I.
• Publisher: Berlin, Springer.
• Publication Date: 2004
• Language: English
• ISBN 10: 3540005277
• ISBN 13: 9783540005278
• Binding: Hardcover
• Weight: 816 grams
• Seller catalogs:
  • Physik

About this title

Synopsis

This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.

Review

From the reviews:

"The editors have done an excellent job of maintaining a coherent theme throughout, while keeping the repetition of ideas to a minimum. It is therefore effective when read as a whole but will also find good use as a reference book."....."This is an excellent book for all users of SPM interested in real technological applications".
Steven R. Schofield, School of Mathematical and Physical Sciences, University of Newcastle
Journal: "The Physicist", Vol. 41, No. 6, p. 200

"This book describes some of the many ways in which SPMs are being used in the development and characterisation of real nano technological processes and devices. The editors have done an excellent job of maintaining a coherent theme throughout ... . It is therefore effective when read as a whole but will also find good use as a reference book. ... This is an excellent book for all users of SPM interested in real technological applications." (Steven R Schofield, The Physicist, Vol. 41 (6), November/December, 2004)

"The focus of this book is recent, practical applications of scanning probe microscopy (SPM). Because it is written by leading experts in SPM techniques, the book is strongly recommended to those working in the emerging area of nanotechnology. ... Each chapter contains the relevant references and the book ends with a comprehensive index." (Mircea Dragoman, Optics and Photonics News, April, 2006)