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Applied Scanning Probe Methods I

Bharat Bhushan

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ISBN 10: 3540005277 / ISBN 13: 9783540005278
Published by Springer Jan 2004, 2004
New Condition: Neu
From Agrios-Buch (Bergisch Gladbach, Germany)

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Neuware - This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques willbenefit from the international perspective assembled in the book. 476 pp. Englisch. Bookseller Inventory # 9783540005278

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Bibliographic Details

Title: Applied Scanning Probe Methods I

Publisher: Springer Jan 2004

Publication Date: 2004

Binding: Buch

Book Condition:Neu

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Synopsis:

Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM.

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Text: German

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