Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and Rbdo Method

Language: English

Published by John Wiley & Sons, 2021

1786306875 / 9781786306876

  • Hardcover
  • New
See all details

Seller: moluna, Greven, Germanymoluna

5-star seller

AbeBooks seller since July 9, 2020

View this seller's items
Hardcover

Condition: New

£ 148.65

£ 41.90 shipping 
Ships from Germany to U.S.A.

Quantity: Over 20 available

Add to basket
Free 30-day returns

Item description from seller

Pierre Richard Dahoo is Professor and Holder of the Chair of Materials Simulation and Engineering at the University of Versailles Saint-Quentin in France. He is Director of Institut des Sciences et Techniques des Yvelines and a specialist in modeling and sp.

Seller Inventory # 443662673

Title
Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and Rbdo Method
Author
PR Dahoo
Publisher
John Wiley & Sons
Publication year
2021
Condition
New
Binding
Gebunden
Language
English
ISBN 10
1786306875
ISBN 13
9781786306876
Seller catalogs
Importe

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item26 to 60 business days26 to 60 business days
First item£ 41.90£ 41.90
Delivery times are set by sellers and vary by carrier and location. Orders passing through Customs may face delays and buyers are responsible for any associated duties or fees. Sellers may contact you regarding additional charges to cover any increased costs to ship your items.

Payment methods

  • Visa
  • Mastercard
  • American Express
  • Apple Pay
  • Google Pay
  • Bank Wire Transfer
  • Check
  • Paypal

Store description

Online Handel nur mit Neubüchern

Seller's business information

Moluna GmbH

Engberdingdamm 27
Greven, Germany 48268