Angewandte Oberflächenanalyse mit SIMS (Sekundär-Ionen-Massenspektrometrie), AES (Auger-Elektronen-Spektrometrie), XPS (Röntgen-Photoelektronen-Spektrometrie).

Grasserbauer, Manfred, Hans J. Dudek und Maria F. Ebel:

Published by Berlin etc.: Springer, 1986
Language: German
Used Condition: Gut

From Antiquariat Thomas Haker GmbH & Co. KG, Berlin, Germany

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