Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits

Gordon W. Roberts

ISBN 10: 0792395646 / ISBN 13: 9780792395645

Published by Springer, Springer, 1995

About this Item

Druck auf Anfrage Neuware - Printed after ordering - Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.

Seller Inventory # 9780792395645

Bibliographic Details

• Title: Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
• Publisher: Springer, Springer
• Publication Date: 1995
• Language: English
• ISBN 10: 0792395646
• ISBN 13: 9780792395645
• Binding: Buch
• Condition: Neu
• Dimensions: 235W x 157H x 13D millimeters 235 millimeters width by 157 millimeters height by 13 millimeters depth
• Weight: 361 grams

About this title

Synopsis

Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.