Advances in X-Ray Diffractometry and X-Ray Spectrography: A Volume of Fifteen Selected Reprints from Philips Laboratories Irvington-on-Hudson, New York, U.S.A.

Parrish, William:

Published by Centrex, 1962
Language: English
Condition: Used - Very good

Sold by books4less (Versandantiquariat Petra Gros GmbH & Co. KG), Welling, Germany

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Used

Condition: Used - Very good

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