Advances in X-Ray Analysis: Volume 39

Gilfrich, John V.|Noyan, I. Cev|Jenkins, Ron|Huang, Ting C.|Snyder, Robert L.|Smith, Deane K.|Zaitz, Mary Ann|Predecki, Paul K.

ISBN 10: 0306458039 ISBN 13: 9780306458033
Published by Springer US, 1998
Language: English
Condition: New Hardcover

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