Advances in X-Ray Analysis. Volume 32.

Barrett, Charles S.;Jenkins, Ron;Gilfrich, John V.;Huang, Ting C.;P.R.E.D.

ISBN 10: 0306432366 / ISBN 13: 9780306432361

Published by New York, New York, U.S.A.: Plenum Pub Corp, 1989

Hardback in very good condition with very good dust jacket. Volume 32. Seller Inventory # 6390

Synopsis:

The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. As usual, alternating with x-ray diffraction, the emphasis this year was x-ray fluorescence, but as has been the pattern for several occasions over the last few years, the Plenary Session did not deal with that subject, specifically. In an attempt to introduce the audience to one of the new developments in x-ray analysis, the title of the session was "High Brilliance Sources/Applications," and dealt exclusively with synchrotron radiation, a topic which has made a very large impact on the x-ray community over the last decade. As the organizer and co-chairman of the Plenary Session (with Paul Predecki), it is my responsibility to report on that session here. The Conference had the privilege of obtaining the services of some of the preeminent practitioners of research using this remarkable x-ray source; they presented the audience with unusually lucid descriptions of the work which has been accomplished in the development and application of the continuous, high intensity, tunable, polarized and collimated x-rays available from no facility other than these specialized storage rings. The opening lecture (and I use that term intentionally) was an enthusiastic description of "What is Synchrotron Radiation?" by Professor Boris Batterman of Cornell University and the Cornell High Energy Synchrotron Sourc(! (CHESS).

Synopsis: Proceedings of the 37th Annual Conference, Aug. 1988, Steamboat Springs, Colo. Papers consider the following topics: high brilliance sources/applications; XRF mathematical models and quantification; XRF applications; analysis of thin films by XRD and XRF; x-ray stress analysis; digitized XRD patterns; qualitative and quantification phase analysis d

Bibliographic Details

Title: Advances in X-Ray Analysis. Volume 32.
Publisher: New York, New York, U.S.A.: Plenum Pub Corp
Publication Date: 1989
Binding: Hardcover
Condition: Very Good
Dust Jacket Condition: Very Good