Advances in X-Ray Analysis

Predecki, Paul K. (EDT); Bowen, D. Keith (EDT); Gilfrich, John V. (EDT); Goldsmith, Charles C. (EDT); Huang, Ting C. (EDT); Jenkins, Ron (EDT); Noyan, I. Cev (EDT); Smith, Deane K. (EDT)

ISBN 10: 0306450453 ISBN 13: 9780306450457
Published by Springer, 1995
Language: English
Condition: New Hardcover

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