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Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability. Seller Inventory # ASNT3-73115
The 39th Denver Conference on Applications of X-ray Analysis was held July 31-August 4, 1995, at the Sheraton Hotel, Colorado Springs, Colorado. The year 1995 was a special year for the X-ray analysis community, since it represented the 100th anniversary ofthe discovery ofX-rays by Wilhelm Roentgen. In commemoration of this event, the Plenary Session of the conference was entitled "THE ROENTGEN COMMEMORATIVE SESSION:1895-1995, "100 YEARS OF PROGRESS IN X-RA Y SCIENCE AND APPLICATIONS". It is interesting to note that while we celebrate 100 years ofthe use ofX-ray techniques in general, and about 80 years ofX-ray diffraction and spectroscopy in particular, the Denver X-ray Conference has been in place for about half ofthat time period! Like the X-ray methods it represents, the Denver Conference on Applications ofX-ray Analysis has grown and matured, has survived the rigors oftime, and today, provides the worlds' best annual forum for the exchange of experiences and developments in the various fields ofX-ray analysis. Imagine, when the Denver Conference started in 1951, there were no personal computer- in fact, there were no computers, period! There was no SEM, no microprobe, there were no Si(Li) detectors, no transistors, no synchrotrons, Hugo Rietveld was a child, and many members who regularly attend Denver Meetings today, weren't even born yet! As I write this foreword, a copy of volurne 1 of Advances in X-ray Analysis lays in front of me on my desk.
Synopsis: Proceedings of the July 1995 conference. One hundred papers describe important work in X-ray diffraction (XRD), reflectivity, and fluorescence. Topics include the evolution of X-ray instrumentation, techniques, and software; conditioning of X-ray beams and other developments in X-ray instrumentation; stress and strain determination by diffraction m
Title: Advances In X-Ray Analysis
Publisher: Springer
Publication Date: 1998
Binding: Soft cover
Condition: New
Seller: Majestic Books, Hounslow, United Kingdom
Condition: New. pp. 932 68:B&W 7 x 10 in or 254 x 178 mm Case Laminate on White w/Gloss Lam. Seller Inventory # 7600926
Quantity: 4 available
Seller: Biblios, Frankfurt am main, HESSE, Germany
Condition: New. pp. 932. Seller Inventory # 18279755
Seller: Books Puddle, New York, NY, U.S.A.
Condition: New. pp. 932. Seller Inventory # 26279745
Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Condition: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide. Seller Inventory # ABBB-73115
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Condition: New. In. Seller Inventory # ria9780306458033_new
Quantity: Over 20 available
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Condition: New. Seller Inventory # 6524800-n
Seller: moluna, Greven, Germany
Gebunden. Condition: New. Proceedings of the Forty-fourth Annual Conference on Applications of X-Ray Analysis held in Colorado, Springs, Colorado, July 31-August 4, 1995 The 39th Denver Conference on Applications of X-ray Analysis was held July 31-August 4, 1995, at the Sherat. Seller Inventory # 458417492
Quantity: Over 20 available
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Condition: As New. Unread book in perfect condition. Seller Inventory # 6524800
Seller: AHA-BUCH GmbH, Einbeck, Germany
Buch. Condition: Neu. Neuware - The 39th Denver Conference on Applications of X-ray Analysis was held July 31-August 4, 1995, at the Sheraton Hotel, Colorado Springs, Colorado. The year 1995 was a special year for the X-ray analysis community, since it represented the 100th anniversary ofthe discovery ofX-rays by Wilhelm Roentgen. In commemoration of this event, the Plenary Session of the conference was entitled 'THE ROENTGEN COMMEMORATIVE SESSION:1895-1995, '100 YEARS OF PROGRESS IN X-RA Y SCIENCE AND APPLICATIONS'. It is interesting to note that while we celebrate 100 years ofthe use ofX-ray techniques in general, and about 80 years ofX-ray diffraction and spectroscopy in particular, the Denver X-ray Conference has been in place for about half ofthat time period! Like the X-ray methods it represents, the Denver Conference on Applications ofX-ray Analysis has grown and matured, has survived the rigors oftime, and today, provides the worlds' best annual forum for the exchange of experiences and developments in the various fields ofX-ray analysis. Imagine, when the Denver Conference started in 1951, there were no personal computer- in fact, there were no computers, period! There was no SEM, no microprobe, there were no Si(Li) detectors, no transistors, no synchrotrons, Hugo Rietveld was a child, and many members who regularly attend Denver Meetings today, weren't even born yet! As I write this foreword, a copy of volurne 1 of Advances in X-ray Analysis lays in front of me on my desk. Seller Inventory # 9780306458033