Advances in X-Ray Analysis

Language: English

Published by Springer, Springer Nov 2012, 2012

1461365325 / 9781461365327

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Softcover

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This item is printed on demand - Print on Demand Titel. Neuware -Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 648 pp. Englisch.

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Bibliographic details

Title
Advances in X-Ray Analysis
Author
C. S. Barrett
Publisher
Springer, Springer Nov 2012
Publication year
2012
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
1461365325
ISBN 13
9781461365327
Item weight
1,100 grams
Dimensions
244x170x35 mm

buchversandmimpf2000

Emtmannsberg, BAYE, Germany

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AbeBooks seller since January 23, 2017

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