Advances in Pattern Recognition: Icapr 2001 : Second International Conference, Rio De Janeiro, Brazil, March 11-14, 2001 : Proceedings

International Conference on Advances in Pattern Recognition (2nd : 2001 : Rio de Janeiro, Brazil)/ Murshed, Nabeel A. (Editor)/ Kropatsch, Walter G. (Editor)/ Singh, Sameer (Editor)/ Singh, Sameer/ Murshed, Nabeel A./ Kropatsch, Walter G.

ISBN 10: 3540417672 ISBN 13: 9783540417675
Published by Springer Verlag, 2001
Language: English
Condition: New Soft cover

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