Advances in Imaging and Electron Physics, Volume 131 (Advances in Imaging and Electron Physics). This item is unavailable.
Language: English
Published by Academic Pr, 2004
Series: Book 16 of 77 - ISSN
- Hardcover
- New

Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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Hardcover
Condition: New
£ 187.60
Item description from seller
1st edition. 248 pages. 9.00x6.00x0.75 inches. In Stock.
Seller Inventory # __0120147734
- Title
- Advances in Imaging and Electron Physics, Volume 131 (Advances in Imaging and Electron Physics)
- Author
- Hawkes, Peter W. (Editor)/ Kazan, Benjamin (Editor)/ Mulvey, Tom (Editor)
- Publisher
- Academic Pr
- Publication year
- 2004
- Condition
- Brand New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 0120147734
- ISBN 13
- 9780120147731
- Item weight
- 0.57 kilograms
- Series
- Book 16 of 77: ISSN
The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This book is essential reading for electrical engineers, applied mathematicians and robotics experts.
- Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics
- Presents theory and it's application in a practical sense, providing long awaited solutions and new findings
- Bridges the gap between academic researchers and R&D designers by addressing and solving daily issues
"Synopsis" may belong to another edition of this title.
About the Author
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
"About the title" may belong to another edition of this title.