Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers: Vol 160

Hawkes, Peter W. (Editor)

ISBN 10: 0123810175 / ISBN 13: 9780123810175

Published by Academic Pr, 2010

About this Item

1st edition. 296 pages. 9.25x6.25x0.75 inches. In Stock.

Seller Inventory # __0123810175

Bibliographic Details

• Title: Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers: Vol 160
• Publisher: Academic Pr
• Publication Date: 2010
• Language: English
• ISBN 10: 0123810175
• ISBN 13: 9780123810175
• Binding: Hardcover
• Condition: Brand New

About this title

Synopsis

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

• Contributions from leading international scholars and industry experts
• Discusses hot topic areas and presents current and future research trends
• Invaluable reference and guide for physicists, engineers and mathematicians

About the Author

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.