Advanced Verification Topics. This item is unavailable.
Bhattacharya, Bishnupriya; Decker, John; Hall, Gary; Heaton, Nick; Kashai, Yaron; Khan, Neyaz; Kirshenbaum, Zeev; Shneydor, Efrat
Language: English
Published by Lulu.com, 2011
- Softcover
- New

Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Softcover
Condition: New
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Item description from seller
In English.
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- Title
- Advanced Verification Topics
- Author
- Bhattacharya, Bishnupriya; Decker, John; Hall, Gary; Heaton, Nick; Kashai, Yaron; Khan, Neyaz; Kirshenbaum, Zeev; Shneydor, Efrat
- Publisher
- Lulu.com
- Publication year
- 2011
- Condition
- New
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 1105113752
- ISBN 13
- 9781105113758
- Item weight
- 574 grams
The Accellera Universal Verification Methodology (UVM) standard is architected to scale, but verification is growing and in more than just the digital design dimension. It is growing in the SoC dimension to include low-power and mixed-signal and the system integration dimension to include multi-language support and acceleration. These items and others all contribute to the quality of the SOC so the Metric-Driven Verification (MDV) methodology is needed to unify it all into a coherent verification plan. This book is for verification engineers and managers familiar with the UVM and the benefits it brings to digital verification but who also need to tackle specialized tasks. It is also written for the SoC project manager that is tasked with building an efficient worldwide team. While the task continues to become more complex, Advanced Verification Topics describes methodologies outside of the Accellera UVM standard, but that build on it, to provide a way for SoC teams to stay productive and profitable.
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