Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Echlin, Patrick; Fiori, C.E.; Goldstein, Joseph; Joy, David C.; Newbury, Dale E.

ISBN 10: 1475790295 ISBN 13: 9781475790290
Published by Springer, 2013
Language: English
Condition: New Soft cover

Sold by Ria Christie Collections, Uxbridge, United Kingdom

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