Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Patrick Echlin|C.E. Fiori|Joseph Goldstein|David C. Joy|Dale E. Newbury

ISBN 10: 1475790295 ISBN 13: 9781475790290
Published by Springer US, 2013
Language: English
Condition: New Soft cover

Sold by moluna, Greven, Germany

AbeBooks Seller since 9 July 2020

Seller rating 4 out of 5 stars 4-star rating, Learn more about seller ratings

View this seller's items


New - Soft cover

Condition: New

Price:
£ 82.65
£ 42.60 shipping
Ships from Germany to U.S.A.

Quantity: Over 20 available

Add to basket