Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Patrick Echlin|C.E. Fiori|Joseph Goldstein|David C. Joy|Dale E. Newbury

ISBN 10: 1475790295 ISBN 13: 9781475790290
Published by Springer US, 2013
Language: English
New Condition: New Soft cover

From moluna, Greven, Germany

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