Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation

Xia, Fangzhou,Rangelow, Ivo W.,Youcef-Toumi, Kamal

ISBN 10: 3031442326 ISBN 13: 9783031442322
Published by Springer, 2024
Language: English
Condition: Used - Fine Hardcover

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Used - Hardcover

Condition: Used - Fine

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