Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation

Xia, Fangzhou; Rangelow, Ivo W.; Youcef-Toumi, Kamal

ISBN 10: 3031442326 ISBN 13: 9783031442322
Published by Springer, 2024
Language: English
Condition: New Hardcover

Sold by Biblios, Frankfurt am main, HESSE, Germany

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