Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation

Xia, Fangzhou; Rangelow, Ivo W.; Youcef-Toumi, Kamal

ISBN 10: 3031442326 ISBN 13: 9783031442322
Published by Springer, 2024
Language: English
Condition: New Hardcover

Sold by Books Puddle, New York, NY, U.S.A.

AbeBooks Seller since 22 November 2018

Seller rating 4 out of 5 stars 4-star rating, Learn more about seller ratings

View this seller's items


New - Hardcover

Condition: New

Price:
£ 78.51
£ 3.02 shipping
Ships within U.S.A.

Quantity: 1 available

Add to basket