Accuracy in Trace Analysis: Sampling, Sample Handling, Analysis, Volume 1: Proceedings of the 7th Materials Research Symposium

Language: English

Published by U.S. Department of Commerce, 1976

  • Hardcover
  • Used
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Seller: BookDepart, Shepherdstown, WV, U.S.A.BookDepart

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Hardcover

Condition: Used - Very good

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Item description from seller

Hardcover, Volume 1 only; NBS Special Publication 422; proceedings held at the National Bureau of Standards in Gaithersburg, Maryland, October 7-11, 1 974; light fading, light shelf wear to exterior; otherwise in very good con dition with clean text, firm binding.

Seller Inventory # 78044

Bibliographic details

Title
Accuracy in Trace Analysis: Sampling, Sample Handling, Analysis, Volume 1: Proceedings of the 7th Materials Research Symposium
Author
Lafleur, Philip D., Editor
Publisher
U.S. Department of Commerce
Publication year
1976
Condition
UsedVeryGood
Binding
Hardcover
Language
English

BookDepart

Shepherdstown, WV, U.S.A.

5-star seller

AbeBooks seller since April 18, 1998

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