Accelerated Life Testing of One-shot Devices
Language: English
Published by John Wiley and Sons Inc, US, 2021
- Hardcover
- New
Seller: Rarewaves.com USA, London, London, United KingdomRarewaves.com USA
AbeBooks seller since June 11, 2025
Condition: New
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Add to basketItem description from seller
Provides authoritative guidance on statistical analysis techniques and inferential methods for one-shot device life-testing Estimating the reliability of one-shot devices-electro-expolsive devices, fire extinguishers, automobile airbags, and other units that perform their function only once-poses unique analytical challenges to conventional approaches. Due to how one-shot devices are censored, their precise failure times cannot be obtained from testing. The condition of a one-shot device can only be recorded at a specific inspection time, resulting in a lack of lifetime data collected in life-tests. Accelerated Life Testing of One-shot Devices: Data Collection and Analysis addresses the fundamental issues of statistical modeling based on data collected from accelerated life-tests of one-shot devices. The authors provide inferential methods and procedures for planning accelerated life-tests, and describe advanced statistical techniques to help reliability practitioners overcome estimation problems in the real world. Topics covered include likelihood inference, competing-risks models, one-shot devices with dependent components, model selection, and more. Enabling readers to apply the techniques to their own lifetime data and arrive at the most accurate inference possible, this practical resource: Provides expert guidance on comprehensive data analysis of one-shot devices under accelerated life-testsDiscusses how to design experiments for data collection from efficient accelerated life-tests while conforming to budget constraintsHelps readers develops optimal designs for constant-stress and step-stress accelerated life-tests, mainstream life-tests commonly used in reliability practiceIncludes R code in each chapter for readers to use in their own analyses of one-shot device testing dataFeatures numerous case studies and practical examples throughoutHighlights important issues, problems, and future research directions in reliability theory and practice Accelerated Life Testing of One-shot Devices: Data Collection and Analysis is essential reading for graduate students, researchers, and engineers working on accelerated life testing data analysis.…
Seller Inventory # LU-9781119664000
- Title
- Accelerated Life Testing of One-shot Devices
- Author
- Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling
- Publisher
- John Wiley and Sons Inc, US
- Publication year
- 2021
- Condition
- New
- Binding
- Hardback
- Language
- English
- ISBN 10
- 1119664004
- ISBN 13
- 9781119664000
- Item weight
- 470 grams
Provides authoritative guidance on statistical analysis techniques and inferential methods for one-shot device life-testing
Estimating the reliability of one-shot devices―electro-expolsive devices, fire extinguishers, automobile airbags, and other units that perform their function only once―poses unique analytical challenges to conventional approaches. Due to how one-shot devices are censored, their precise failure times cannot be obtained from testing. The condition of a one-shot device can only be recorded at a specific inspection time, resulting in a lack of lifetime data collected in life-tests.
Accelerated Life Testing of One-shot Devices: Data Collection and Analysis addresses the fundamental issues of statistical modeling based on data collected from accelerated life-tests of one-shot devices. The authors provide inferential methods and procedures for planning accelerated life-tests, and describe advanced statistical techniques to help reliability practitioners overcome estimation problems in the real world. Topics covered include likelihood inference, competing-risks models, one-shot devices with dependent components, model selection, and more. Enabling readers to apply the techniques to their own lifetime data and arrive at the most accurate inference possible, this practical resource:
- Provides expert guidance on comprehensive data analysis of one-shot devices under accelerated life-tests
- Discusses how to design experiments for data collection from efficient accelerated life-tests while conforming to budget constraints
- Helps readers develops optimal designs for constant-stress and step-stress accelerated life-tests, mainstream life-tests commonly used in reliability practice
- Includes R code in each chapter for readers to use in their own analyses of one-shot device testing data
- Features numerous case studies and practical examples throughout
- Highlights important issues, problems, and future research directions in reliability theory and practice
"Synopsis" may belong to another edition of this title.
About the Author
NARAYANASWAMY BALAKRISHNAN, PhD, is Distinguished University Professor, Department of Mathematics and Statistics, McMaster University, Hamilton, Ontario, Canada.
MAN HO LING, PhD, is Associate Professor, Department of Mathematics and Information Technology, The Education University of Hong Kong, Hong Kong SAR, China.
HON YIU SO is Post-Doctoral Fellow, University of Waterloo, Waterloo, Ontario, Canada.
"About the title" may belong to another edition of this title.
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