This is the first technical book that considers tests as public tools and examines how to engineer and process test data, extract the structure within the data to be visualized, and thereby make test results useful for students, teachers, and the society. The author does not differentiate test data analysis from data engineering and information visualization. This monograph introduces the following methods of engineering or processing test data, including the latest machine learning techniques: classical test theory (CTT), item response theory (IRT), latent class analysis (LCA), latent rank analysis (LRA), biclustering (co-clustering), and Bayesian network model (BNM). CTT and IRT are methods for analyzing test data and evaluating students’ abilities on a continuous scale. LCA and LRA assess examinees by classifying them into nominal and ordinal clusters, respectively, where the adequate number of clusters is estimated from the data. Biclustering classifies examinees into groups (latent clusters) while classifying items into fields (factors). Particularly, the infinite relational model discussed in this book is a biclustering method feasible under the condition that neither the number of groups nor the number of fields is known beforehand. Additionally, the local dependence LRA, local dependence biclustering, and bicluster network model are methods that search and visualize inter-item (or inter-field) network structure using the mechanism of BNM. As this book offers a new perspective on test data analysis methods, it is certain to widen readers’ perspective on test data analysis.
"synopsis" may belong to another edition of this title.
Kojiro Shojima is Associate Professor at The National Center for University Entrance Examinations. He is a psychometrician living in Tokyo with his (lovely) wife and two (angelic) daughters.
This is the first technical book that considers tests as public tools and examines how to engineer and process test data, extract the structure within the data to be visualized, and thereby make test results useful for students, teachers, and the society. The author does not differentiate test data analysis from data engineering and information visualization. This monograph introduces the following methods of engineering or processing test data, including the latest machine learning techniques: classical test theory (CTT), item response theory (IRT), latent class analysis (LCA), latent rank analysis (LRA), biclustering (co-clustering), and Bayesian network model (BNM). CTT and IRT are methods for analyzing test data and evaluating students’ abilities on a continuous scale. LCA and LRA assess examinees by classifying them into nominal and ordinal clusters, respectively, where the adequate number of clusters is estimated from the data. Biclustering classifies examinees into groups (latent clusters) while classifying items into fields (factors). Particularly, the infinite relational model discussed in this book is a biclustering method feasible under the condition that neither the number of groups nor the number of fields is known beforehand. Additionally, the local dependence LRA, local dependence biclustering, and bicluster network model are methods that search and visualize inter-item (or inter-field) network structure using the mechanism of BNM. As this book offers a new perspective on test data analysis methods, it is certain to widen readers’ perspective on test data analysis.
"About this title" may belong to another edition of this title.
Seller: Brook Bookstore On Demand, Napoli, NA, Italy
Condition: new. Questo è un articolo print on demand. Seller Inventory # ZZGWEXI7MG
Quantity: Over 20 available
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Condition: New. In. Seller Inventory # ria9789811699856_new
Quantity: Over 20 available
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This is the first technical book that considers tests as public tools and examines how to engineer and process test data, extract the structure within the data to be visualized, and thereby make test results useful for students, teachers, and the society. The author does not differentiate test data analysis from data engineering and information visualization. This monograph introduces the following methods of engineering or processing test data, including the latest machine learning techniques: classical test theory (CTT), item response theory (IRT), latent class analysis (LCA), latent rank analysis (LRA), biclustering (co-clustering), and Bayesian network model (BNM). CTT and IRT are methods for analyzing test data and evaluating students' abilities on a continuous scale. LCA and LRA assess examinees by classifying them into nominal and ordinal clusters, respectively, where the adequate number of clusters is estimated from the data. Biclustering classifies examinees into groups (latent clusters) while classifying items into fields (factors). Particularly, the infinite relational model discussed in this book is a biclustering method feasible under the condition that neither the number of groups nor the number of fields is known beforehand. Additionally, the local dependence LRA, local dependence biclustering, and bicluster network model are methods that search and visualize inter-item (or inter-field) network structure using the mechanism of BNM. As this book offers a new perspective on test data analysis methods, it is certain to widen readers' perspective on test data analysis. 604 pp. Englisch. Seller Inventory # 9789811699856
Seller: moluna, Greven, Germany
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This is the first technical book that considers tests as public tools and examines how to engineer and process test data, extract the structure within the data to be visualized, and thereby make test results useful for students, teachers, and the society. Seller Inventory # 543921144
Quantity: Over 20 available
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Condition: New. Seller Inventory # 44751696-n
Seller: Books Puddle, New York, NY, U.S.A.
Condition: New. 1st ed. 2022 edition NO-PA16APR2015-KAP. Seller Inventory # 26396346584
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Condition: As New. Unread book in perfect condition. Seller Inventory # 44751696
Seller: Majestic Books, Hounslow, United Kingdom
Condition: New. Print on Demand. Seller Inventory # 401111815
Quantity: 4 available
Seller: Biblios, Frankfurt am main, HESSE, Germany
Condition: New. PRINT ON DEMAND. Seller Inventory # 18396346578
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This is the first technical book that considers tests as public tools and examines how to engineer and process test data, extract the structure within the data to be visualized, and thereby make test results useful for students, teachers, and the society. The author does not differentiate test data analysis from data engineering and information visualization. This monograph introduces the following methods of engineering or processing test data, including the latest machine learning techniques: classical test theory (CTT), item response theory (IRT), latent class analysis (LCA), latent rank analysis (LRA), biclustering (co-clustering), and Bayesian network model (BNM). CTT and IRT are methods for analyzing test data and evaluating students' abilities on a continuous scale. LCA and LRA assess examinees by classifying them into nominal and ordinal clusters, respectively, where the adequate number of clusters is estimated from the data. Biclustering classifies examinees into groups (latent clusters) while classifying items into fields (factors). Particularly, the infinite relational model discussed in this book is a biclustering method feasible under the condition that neither the number of groups nor the number of fields is known beforehand. Additionally, the local dependence LRA, local dependence biclustering, and bicluster network model are methods that search and visualize inter-item (or inter-field) network structure using the mechanism of BNM. As this book offers a new perspective on test data analysis methods, it is certain to widen readers' perspective on test data analysis.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 604 pp. Englisch. Seller Inventory # 9789811699856