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Synopsis
Materials metrology, a burgeoning branch of the field, is a subject of intense scrutiny by both researchers and stakeholders. The focal points of their attention are twofold: understanding the objectives of material metrology research and determining effective methods for utilizing its findings. Researchers and stakeholders delve into the intricacies of ensuring traceability of complex units from equipment and maintaining consistency in measurement results across various methods. The application of materials metrology extends to calibrating equipment and/or measurement methods, as well as utilizing critical data for production assessments. Graphene's emergence sparked widespread interest across various fields. The rapid progress of graphene and related two-dimensional materials in both research and industrial applications necessitates robust support from metrology, standards, and conformity assessment, collectively known as national quality infrastructures (NQI). This book, using graphene and related two-dimensional materials as exemplars, explores fundamental concepts and terminologies of metrology and materials metrology, elucidates the technological framework of metrology and standards, and elaborates on various metrological techniques for the structural characterization of graphene and related materials, including Raman spectroscopy, X-ray diffraction, atomic force microscopy, and electron microscopy. Additionally, the book presents techniques for quality evaluation, such as X-ray photoelectron spectroscopy, inductively coupled plasma mass spectrometry, and Fourier transform infrared spectrometry. By leveraging established standard measurement instruments, reference materials, measurement methods, and interlaboratory comparisons, this book endeavors to attain accurate and consistent measurement results. Globally equivalent results can guarantee the quality of graphene products, fostering standardization, mass production, and sustainable advancement within the graphene industry.
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Quality Infrastruc Graphene & Related Two-Dimension Material
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Quality Infrastructure Of Graphene And Related Two-dimensional Materials: Metrology
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QUALITY INFRASTRUCTURE OF GRAPHENE AND RELATED TWO-DIMENSIONAL MATERIALS: METROLOGY
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World Scientific Publishing Co Pte Ltd, SG, 2024
ISBN 10: 9811295700
ISBN 13: 9789811295706
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Hardback. Condition: New. Materials metrology, a burgeoning branch of the field, is a subject of intense scrutiny by both researchers and stakeholders. The focal points of their attention are twofold: understanding the objectives of material metrology research and determining effective methods for utilizing its findings. Researchers and stakeholders delve into the intricacies of ensuring traceability of complex units from equipment and maintaining consistency in measurement results across various methods. The application of materials metrology extends to calibrating equipment and/or measurement methods, as well as utilizing critical data for production assessments.Graphene's emergence sparked widespread interest across various fields. The rapid progress of graphene and related two-dimensional materials in both research and industrial applications necessitates robust support from metrology, standards, and conformity assessment, collectively known as national quality infrastructures (NQI). This book, using graphene and related two-dimensional materials as exemplars, explores fundamental concepts and terminologies of metrology and materials metrology, elucidates the technological framework of metrology and standards, and elaborates on various metrological techniques for the structural characterization of graphene and related materials, including Raman spectroscopy, X-ray diffraction, atomic force microscopy, and electron microscopy. Additionally, the book presents techniques for quality evaluation, such as X-ray photoelectron spectroscopy, inductively coupled plasma mass spectrometry, and Fourier transform infrared spectrometry. By leveraging established standard measurement instruments, reference materials, measurement methods, and interlaboratory comparisons, this book endeavors to attain accurate and consistent measurement results.Globally equivalent results can guarantee the quality of graphene products, fostering standardization, mass production, and sustainable advancement within the graphene industry. Seller Inventory # LU-9789811295706
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Quality Infrastructure of Graphene and Related Two-Dimensional Materials: Metrology
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QUALITY INFRASTRUC GRAPHENE & RELATED TWO-DIMENSION MATERIAL
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Buch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Materials metrology, a burgeoning branch of the field, is a subject of intense scrutiny by both researchers and stakeholders. The focal points of their attention are twofold: understanding the objectives of material metrology research and determining effective methods for utilizing its findings. Researchers and stakeholders delve into the intricacies of ensuring traceability of complex units from equipment and maintaining consistency in measurement results across various methods. The application of materials metrology extends to calibrating equipment and/or measurement methods, as well as utilizing critical data for production assessments.Graphene's emergence sparked widespread interest across various fields. The rapid progress of graphene and related two-dimensional materials in both research and industrial applications necessitates robust support from metrology, standards, and conformity assessment, collectively known as national quality infrastructures (NQI). This book, using graphene and related two-dimensional materials as exemplars, explores fundamental concepts and terminologies of metrology and materials metrology, elucidates the technological framework of metrology and standards, and elaborates on various metrological techniques for the structural characterization of graphene and related materials, including Raman spectroscopy, X-ray diffraction, atomic force microscopy, and electron microscopy. Additionally, the book presents techniques for quality evaluation, such as X-ray photoelectron spectroscopy, inductively coupled plasma mass spectrometry, and Fourier transform infrared spectrometry. By leveraging established standard measurement instruments, reference materials, measurement methods, and interlaboratory comparisons, this book endeavors to attain accurate and consistent measurement results.Globally equivalent results can guarantee the quality of graphene products, fostering standardization, mass production, and sustainable advancement within the graphene industry. Seller Inventory # 9789811295706
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QUALITY INFRASTRUC GRAPHENE & RELATED TWO-DIMENSION MATERIAL
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Buch. Condition: Neu. QUALITY INFRASTRUC GRAPHENE & RELATED TWO-DIMENSION MATERIAL | Ren Lingling | Buch | Englisch | 2024 | World Scientific | EAN 9789811295706 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand. Seller Inventory # 129453859
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QUALITY INFRASTRUCTURE OF GRAPHENE AND RELATED TWO-DIMENSIONAL MATERIALS: METROLOGY
Published by
World Scientific Publishing Co Pte Ltd, SG, 2024
ISBN 10: 9811295700
ISBN 13: 9789811295706
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Seller: Rarewaves.com UK, London, United Kingdom
Seller rating 5 out of 5 stars
Hardback. Condition: New. Materials metrology, a burgeoning branch of the field, is a subject of intense scrutiny by both researchers and stakeholders. The focal points of their attention are twofold: understanding the objectives of material metrology research and determining effective methods for utilizing its findings. Researchers and stakeholders delve into the intricacies of ensuring traceability of complex units from equipment and maintaining consistency in measurement results across various methods. The application of materials metrology extends to calibrating equipment and/or measurement methods, as well as utilizing critical data for production assessments.Graphene's emergence sparked widespread interest across various fields. The rapid progress of graphene and related two-dimensional materials in both research and industrial applications necessitates robust support from metrology, standards, and conformity assessment, collectively known as national quality infrastructures (NQI). This book, using graphene and related two-dimensional materials as exemplars, explores fundamental concepts and terminologies of metrology and materials metrology, elucidates the technological framework of metrology and standards, and elaborates on various metrological techniques for the structural characterization of graphene and related materials, including Raman spectroscopy, X-ray diffraction, atomic force microscopy, and electron microscopy. Additionally, the book presents techniques for quality evaluation, such as X-ray photoelectron spectroscopy, inductively coupled plasma mass spectrometry, and Fourier transform infrared spectrometry. By leveraging established standard measurement instruments, reference materials, measurement methods, and interlaboratory comparisons, this book endeavors to attain accurate and consistent measurement results.Globally equivalent results can guarantee the quality of graphene products, fostering standardization, mass production, and sustainable advancement within the graphene industry. Seller Inventory # LU-9789811295706
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