Items related to CMOS RF Circuit Design for Reliability and Variability...

CMOS RF Circuit Design for Reliability and Variability (SpringerBriefs in Applied Sciences and Technology) - Softcover

Yuan, Jiann-Shiun

 
9789811008825: CMOS RF Circuit Design for Reliability and Variability (SpringerBriefs in Applied Sciences and Technology)
Softcover
ISBN 10: 9811008825 ISBN 13: 9789811008825
Publisher: Springer, 2016

Synopsis

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

"synopsis" may belong to another edition of this title.

Publisher
Springer
Publication date
2016
Language
English
ISBN 10 
9811008825
ISBN 13 
9789811008825
Binding
Paperback
Edition number
1
Number of pages
112