Presents essays from the 5th Asia-Pacific conference held in Beijing, China, in 1992.
"synopsis" may belong to another edition of this title.
Seller: California Books, Miami, FL, U.S.A.
Condition: New. Seller Inventory # I-9789810209988
Seller: moluna, Greven, Germany
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Seller Inventory # 909654170
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Seller: preigu, Osnabrück, Germany
Buch. Condition: Neu. ELECTRON MICROSCOPY 1 (P/H) | Z H Zhai K H Kuo | Buch | Englisch | 1992 | World Scientific | EAN 9789810209988 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand. Seller Inventory # 138054033
Seller: Revaluation Books, Exeter, United Kingdom
Hardcover. Condition: Brand New. 660 pages. 8.00x1.94x10.00 inches. In Stock. Seller Inventory # x-9810209983
Quantity: 2 available
Seller: AHA-BUCH GmbH, Einbeck, Germany
Buch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Contents: Some Aspects of Present and Future High Resolution Electron Microscopy and Image Processing (H Hashimoto); Imaging Defects by TEM and SEM (P B Hirsch); Electron Microscopy and Science (E Zeitler); The Significance of Electron Microscopy in Materials Science and Engineering (G Thomas); Defects Characteristics Identification by Means of the Convergent-Beam Electron Diffraction and Imaging Technique (K H Kuo & R H Wang); STM Image 'Artifacts' Studied by Combined In-Situ STM-REM (J C H Spence & W Lo); In Situ REM Study of Structural Transformations on Si Surfaces (A L Aseev et al.); Incoherence Effects in Reflection Electron Microscopy (A Howie et al.); Reflection Electron Holography of Single Crystal Surfaces (H Banzhof et al.); Quantitative Analysis of Electron Diffraction with Imaging Plate (D Shindo et al.); Determination of the Displacement Vector at a Stacking Fault Using Convergent-Beam Electron Diffraction (M Tanaka et al.); Quantitative Structure Images of Crystal Surfaces and Interfaces (M Shiojiri); High Resolution Electron Microscopy of Dislocations in Compound Crystals (K Suzuki & S Takeuchi); TEM-Investigation of an Electron-Irradiated Fe-Cr-Ni Alloy (S Yamamoto & Y Ishida); and other papers; Seller Inventory # 9789810209988
Seller: Buchpark, Trebbin, Germany
Condition: Sehr gut. Zustand: Sehr gut | Seiten: 660 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar. Seller Inventory # 34902793/202