Synopsis
Forword. Abbrevations. Symbols.
1. Introduction. 1.1. A/D Conversion Systems. 1.2. Remarks on Curent Design and Debugging Practice. 1.3. Motivation. 1.4. Organization.
2. Analog to Digital Conversion. 2.1. High-Speed High-Resolution A/D Converter Architectural Choices. 2.2. Notes on Low Voltage A/D Converter Design. 2.3. A/D Converter Building Blocks. 2.4. A/D Converters: Summary.
3. Design of Multi-Step Analog to Digital Converters. 3.1. Multi-Step A/D Converter Architecture. 3.2. Deisgn Considerations for Non-Ideal Multi-Step A/D Converter. 3.3. Time-Interleaved Front-End Sample-and-Hold Circuit. 3.4. Multi-Step A/D Converter Stage Design. 3.5. Inter-Stage Design and Calibration. 3.6. Experimental Results. 3.7. Conclusion.
4. Multi-Step Analog to Digital Converter Testing. 4.1. Analog ATPG for Quasi-Static Structural Test. 4.2. Design for Testability Concept. 4.3. On-Chip Stimulus Generation for BIST Applications. 4.4. Remarks on Built-In Self-Test Concepts. 4.5. Stochastic Analysis of Deep-Submicron CMOS Process. 4.5. Conclusion.
5. Multi-Step Analog to Digital Converter Debugging. 5.1. Concept of Sensor Networks. 5.2. Estimation of Die-Level Process Variations. 5.3. Debugging of Multi-Step A/D Converter Stages. 5.4. DfT for Full Accessability of Multi-Step Converters. 5.5. Debugging of Time-Interleaved Systems. 5.6. Foreground Calibration. 5.7. Experimental Results. 5.8. Conclusion.
6. Conclusions and Recommendations. 6.1. Summary of Results. 6.3. Recommendations and Future Research.
Appendix. References. Index.
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