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Optoelectronic Materials and Devices. testing and evaluation techniques(Chinese Edition) - Softcover
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Language:Chinese.SoftCover.Pub Date:2014-09-01.publisher:Zhengzhou University Press.description:Pub Date: 2014-09-01 Pages: 192 Publisher: Zhengzhou University Press Optoelectronic Materials and Devices. testing and evaluation technology. according to W. E. Three-step model proposed by photoemission of Spicer. a detailed analysis of NEAGaN
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Optoelectronic Materials and Devices. testing and evaluation techniques(Chinese Edition)
Published by
Zhengzhou University Press, 2014
ISBN 10: 7564514884
ISBN 13: 9787564514884
New
paperback
Seller: liu xing, Nanjing, JS, China
Seller rating 5 out of 5 stars
paperback. Condition: New. Language:Chinese.Pub Date: 2014-09-01 Pages: 192 Publisher: Zhengzhou University Press Optoelectronic Materials and Devices. testing and evaluation technology. according to W. E. Three-step model proposed by photoemission of Spicer. a detailed analysis of NEAGaN photocathode excited photoelectrons from the body to transport surface to escape through the surface barrier. the whole process of vacuum derived photoelectron tunneling cathode surface barrier transmission coefficient. By solving the. Seller Inventory # CQ063978