Electronics and Communication Engineering Series: semiconductor physics test(Chinese Edition) - Softcover

Softcover

ISBN 10: 7560336485 ISBN 13: 9787560336480

Synopsis

Paperback. Pub Date: 2012 08 Pages: 152 Language: Chinese in Publisher: Harbin Institute of Technology Electronics and Communication Engineering Series: semiconductor physics test analysis more comprehensive introduction to the basics of semiconductor physics test analysis. Mainly includes: the basic nature of the semiconductor; semiconductor impurity and defect levels. and silicon dislocations and stacking fault observed; statistical distribution of the carriers in the equilibrium state semiconductor. the impurity concentration and its distribution of the measurement technique; carrier oscillator in the law of motion under the electric field. and the Hall coefficient and conductivity measurement methods; law of motion of non-equilibrium carriers and their generation and recombination mechanisms. minority carrier lifetime measurement; pn junction formation process its electr...

Edition details

• Language: Chinese
• ISBN 10: 7560336485
• ISBN 13: 9787560336480
• Binding: Paperback